The Spanish Thematic Network on Supervision and Diagnosis of Complex systems will organize in July 2017 the 7th Intl. Summer School on Fault Diagnosis of Complex systems.
Location : Terrassa, Barcelona (Spain). TR11 Building, UPC Campus de Terrassa.
Dates : July, 3rd-7th, 2017.
Currently, automated diagnosis of devices is an interesting research and development field. It can be approached with different techniques (knowledge-based systems, case-based reasoning, machine-learning or model-based reasoning) coming from different fields: Control Engineering, Artificial Intelligence or Statistics. It is not easy to include several of these techniques in a single course.
This School is an intensive seminar that will take place along 5 days (32 hours) in Terrassa,Barcelona, Spain. Its main goal is introducing students to different diagnosis approaches coming from different research communities: Control Engineering, Artificial Intelligence, Statistics, etc.
The School is open to PhD/master students and also to industrial practitioners interested in these approaches to diagnosis. Successful applications to fields like electronic circuits, chemical processes, continuous industrial processes, automotive, satellites, software, etc. have been made.
T1. INTRODUCTION. FUNDAMENTAL CONCEPTS
- T1.1 Definitions: fault, failure, detection, diagnosis, reliability…
- T1.2 Foundations for fault detection and diagnosis in FDI and DX: detectability, observability, diagnosability
T2. THE FDI APPROACH
- T2.1. Structural analysis and analytical redundancy.
- T2.2. Model-based detection methods: parameter estimation, parity equations, state observers for linear and non-linear models.
- T2.3. Fault detection: residual evaluation by consistency tests, and envelope generators.
- T2.4. Fault isolation: structured and directional residuals.
T3. STATISTICAL APPROACHES TO FAULT DIAGNOSIS
- T3.1. Fault diagnosis using statistical methods.
T4. THE DX APPROACH
- T4.1 Model-based diagnosis from AI Community. Consistency-based diagnosis, CBD: Theoretical (Reiter’s ) approach.
- T4.2 GDE: the computational approach to CBD.
- T4.3. Diagnosing Multiple faults with qualitative models
- T4.4 Constraint-driven fault diagnosis.T4.5. Business Process Modelling for diagnosis
- T5.1. Introduction to Prognostics. concepts. Fundamental concepts.
- T5.2. Electronics PHM.
T6. BRIDGE: INTEGRATION OF FDI AND DX APPROACHES
- T6.1 Theoretical links and comparison.T6.2 Practical comparison and potential synergies.
Accommodation: UPC residence Hipatia.
Address: Carrer Miquel Vives, 20,08222 Terrassa (Barcelona), Spain.
Local organizing committee: Vicenç Puig, Teresa Escobet and Joseba Quevedo (Universitat Politècnica de Catalunya, Spain)
School Steering Committee: Belarmino Pulido and Anibal Bregon (University of Valladolid, Spain)
Special Guests: Erik Frisk (University of Linköping, Sweden), Matthew J. Daigle (NASA Ames Research Center, USA) and Chetan S. Kulkarni (SGT Inc., NASA Ames Research Center, USA)
Academic Staff: C. Alonso (U. Valladolid), J. Armengol (U. Girona), A. Bregón (U. Valladolid), M.J. de la Fuente (U. Valladolid), R. M. Gasca (U. Sevilla), M. Teresa Gómez (U. Sevilla), J. Meléndez (U. Girona), V. Puig (UPC), B. Pulido (U. Valladolid).